Simulation Study on Hard X-Ray Detection Efficiency for Microchannel Plate

An improved detection efficiency model for microchannel plate response to hard X-ray is described, which builds on previous models by incorporating a more detailed consideration of cross talking for photoelectron cross-section between atomic shells in the MCP bulk. An analytical investigation and numerical calculation of the detection efficiency were carried out as function of compositional parameters, channel diameter, wall thickness, MCP thickness, respectively. Furthermore, according to the calculation results and developed technologies, a group of optimized parameters were given out, and 45% detection efficiency was found response to 50 ~ 200 keV X-ray.