Volume 37 Issue 6
Dec 2023
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WANG Xiaomeng, GAO Yang. Atomic Force Microscope Based Indentation Techniques and Their Applications[J]. Chinese Journal of High Pressure Physics, 2023, 37(6): 060103. doi: 10.11858/gywlxb.20230694
Citation: WANG Xiaomeng, GAO Yang. Atomic Force Microscope Based Indentation Techniques and Their Applications[J]. Chinese Journal of High Pressure Physics, 2023, 37(6): 060103. doi: 10.11858/gywlxb.20230694

Atomic Force Microscope Based Indentation Techniques and Their Applications

doi: 10.11858/gywlxb.20230694
  • Received Date: 20 Jul 2023
  • Rev Recd Date: 04 Sep 2023
  • Available Online: 20 Nov 2023
  • Issue Publish Date: 15 Dec 2023
  • Indentation techniques based on atomic force microscopy (AFM) have been widely used in characterizing the mechanical properties of various types of materials, due to their high lateral resolution and vertical precision. This review article begins with a concise introduction to the fundamental principles of AFM and related indentation techniques. Subsequently, it extensively discusses and reviews the applications of AFM-based indentation techniques in measuring the mechanical properties of low-dimensional materials, biological materials, etc. This article also reviews the latest progress of the applications of AFM in the research of high-pressure phase transition in two-dimensional materials. Particularly, we introduce a novel angstrom-indentation technique, which enables atomic-level deformation on the samples. Angstrom-indentation allows for highly effective characterization and tuning of the interlayer coupling in two-dimensional materials. Finally, we make an outlook on the development of AFM-based indentation techniques.

     

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