XIONG Heng, MA Yuhong, SI Bowen, XIAO Gesheng, SHU Xuefeng. Mechanical Properties of Electronic Interconnected Conductive Adhesive and Drop Impact Behavior of Adhesive Bonding Point[J]. Chinese Journal of High Pressure Physics, 2022, 36(3): 034103. doi: 10.11858/gywlxb.20210902
Citation: XIONG Heng, MA Yuhong, SI Bowen, XIAO Gesheng, SHU Xuefeng. Mechanical Properties of Electronic Interconnected Conductive Adhesive and Drop Impact Behavior of Adhesive Bonding Point[J]. Chinese Journal of High Pressure Physics, 2022, 36(3): 034103. doi: 10.11858/gywlxb.20210902

Mechanical Properties of Electronic Interconnected Conductive Adhesive and Drop Impact Behavior of Adhesive Bonding Point

doi: 10.11858/gywlxb.20210902
  • Received Date: 15 Nov 2021
  • Rev Recd Date: 07 Dec 2021
  • Accepted Date: 18 Jan 2022
  • Issue Publish Date: 30 May 2022

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      沈阳化工大学材料科学与工程学院 沈阳 110142

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