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Volume 34 Issue 5
Sep 2020
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Chinese Journal of High Pressure Physics  > 2020  >  34(5): 050103.
LIU Jing. High Pressure Diffraction Using Synchrotron Radiation[J]. Chinese Journal of High Pressure Physics, 2020, 34(5): 050103. doi: 10.11858/gywlxb.20200586
Citation: LIU Jing. High Pressure Diffraction Using Synchrotron Radiation[J]. Chinese Journal of High Pressure Physics, 2020, 34(5): 050103. doi: 10.11858/gywlxb.20200586
shu

High Pressure Diffraction Using Synchrotron Radiation

doi: 10.11858/gywlxb.20200586

  • Institute of High Energy Physics, CAS, Beijing 100049, China

  • Received Date: 06 Jul 2020
  • Rev Recd Date: 14 Jul 2020
  • Publish Date: 25 Sep 2020
    Abstract
  • Synchrotron radiation source can offer wide-spectrum, high-energy, high-brightness, and low-emittance, which has been widely used in high pressure research. Among the X-ray techniques, the X-ray diffraction is one of the most basic and widely used experimental techniques, and is likely to remain the dominant application for high-pressure research in the future. Here the unique properties of synchrotron radiation, the basic composition of the light source, and the concepts of beam lines and experimental stations are briefly introduced. The high-pressure X-ray diffraction based on diamond anvil cells is focused. Various diffraction methods are explained, including powder diffraction, single X-ray diffraction and radial X-ray diffraction, as well as the combination with the laser heating and fast loading techniques. The equipment configuration and the capabilities of the high-pressure beamline at the Beijing Synchrotron Radiation Facility (BSRF) are also described, including the quality of radiation from 4W2 wiggler, X-ray micro-focusing, various diffraction methods and newly developed techniques. At last the opportunities brought by the construction of High Energy Photon Source (HEPS) for high pressure research are prospected.

     

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