DING Yu, HUANG Shenghong. Microscale Self-Similarity Phenomenon of RM Instability on the Copper/Helium Interface with Molecular Dynamics Simulation[J]. Chinese Journal of High Pressure Physics, 2019, 33(2): 022301. doi: 10.11858/gywlxb.20180606
Citation: DING Yu, HUANG Shenghong. Microscale Self-Similarity Phenomenon of RM Instability on the Copper/Helium Interface with Molecular Dynamics Simulation[J]. Chinese Journal of High Pressure Physics, 2019, 33(2): 022301. doi: 10.11858/gywlxb.20180606

Microscale Self-Similarity Phenomenon of RM Instability on the Copper/Helium Interface with Molecular Dynamics Simulation

doi: 10.11858/gywlxb.20180606
  • Received Date: 31 Jul 2018
  • Rev Recd Date: 06 Sep 2018

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      沈阳化工大学材料科学与工程学院 沈阳 110142

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