微通道板对硬X射线探测效率的模拟研究

Simulation Study on Hard X-Ray Detection Efficiency for Microchannel Plate

摘要: 为提升硬X射线探测效率，优化了微通道板对硬X射线响应效率的影响模型，在模型中考虑了微通道板所有材料参数以及结构参数的影响，并进一步考虑了微通道板基底材料原子壳层间相互串扰的影响。在此模型的基础上，分析了微通道板的基底材质、通道直径、通道间壁厚、通道板厚度等参数对其探测效率的影响。基于现有技术条件，给出了微通道板各参数的最佳优化值及相应的探测效率，结果表明，其对50~200 keV能段的硬X射线的探测效率可以达到45%以上。
- 微通道板 /
- 硬X射线 /
- 探测效率
Abstract: An improved detection efficiency model for microchannel plate response to hard X-ray is described, which builds on previous models by incorporating a more detailed consideration of cross talking for photoelectron cross-section between atomic shells in the MCP bulk. An analytical investigation and numerical calculation of the detection efficiency were carried out as function of compositional parameters, channel diameter, wall thickness, MCP thickness, respectively. Furthermore, according to the calculation results and developed technologies, a group of optimized parameters were given out, and 45% detection efficiency was found response to 50 ~ 200 keV X-ray.
- Microchannel Plate /
- Hard X-Ray /
- Detection Efficiency