Physico-Mechanical Behavior and Size Effect of Nano-Tungsten under High Pressure
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摘要: 探究尺寸效应对材料高压物性的影响规律有助于开发具有新颖或者改良特性的新材料。采用金刚石对顶砧结合同步辐射X射线衍射技术，研究了平均晶粒尺寸分别为30和65 nm的多晶钨粉在高压下的静态压缩行为。通过分析每个压力点下X射线衍射图谱的峰位和半高宽等，得到了纳米金属钨在高压下的晶胞体积、晶粒尺寸和微观应变等。通过拟合三阶Birch-Murnaghan方程，得到了30和65 nm钨的体弹模量，分别为257(7) GPa和343(8) GPa。结合前人的研究结果发现，当晶粒尺寸从微米降低至10 nm，钨的屈服强度逐渐增大，10 nm钨的屈服强度较微米晶样品的屈服强度提高了3.5倍；体弹模量呈现先增大后减小的趋势，30 nm钨的体弹模量较65 nm钨减小了25%。Abstract: Exploring the influence of size effect on the physical properties of materials under high pressure is helpful for the development of new materials with novel or improved properties. The static compression behaviors of polycrystalline tungsten powder with average grain sizes of 30 and 65 nm under high pressure were studied by using diamond anvil cell (DAC) combined with synchrotron radiation X-ray diffraction respectively. By analyzing the peak position and the half-height width of the X-ray diffraction spectrum at each pressure, the unit cell volume, grain size, and microscopic strain of nano-tungsten metal under high pressure were obtained. By fitting the third Birch-Murnaghan equation, the bulk moduli of 30 and 65 nm tungsten are obtained to be 257(7) GPa and 343(8) GPa, respectively. Combined with the results of previous studies, it is found that when the gain size decreases from micron to 10 nm, the yield strength of tungsten at 10 nm increases by 3.5 times compared with that of microcrystal samples; the bulk modulus shows a tendency of increasing firstly and then decreasing, and the bulk elastic modulus of tungsten at 30 nm decreases by 25% compared with that of tungsten at 65 nm.
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Key words:
- equation of state /
- yield strength /
- bulk modulus /
- high pressure /
- nanocrystalline
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图 1 30 nm钨样品的SEM图像(a)和尺寸分布(b)
Figure 1. SEM image (a) and size distribution (b) of 30 nm tungsten powder sample
图 2 不同压力下30和65 nm钨的原位XRD谱
Figure 2. In situ XRD patterns of 30 and 65 nm tungsten at different pressures
图 3 30和65 nm钨的晶面间距随压力的变化
Figure 3. Variations of interplanar crystal spacing with pressure for 30 and 65 nm tungsten
图 4 30和65 nm钨样品的(110)、(200)晶面XRD峰的FWHM随压力的变化
Figure 4. FWHMs of XRD peaks for (110) and (200) crystal planes of 30 and 65 nm tungsten samples varies with pressure
图 5 非静水压缩下30和65 nm钨的晶粒尺寸变化
Figure 5. Variations of grain size for 30 and 65 nm tungsten under non-hydrostatic compression
图 6 不同粒径钨的微区偏应力随压力的变化
Figure 6. Microscopic deviatoric stress of tungsten with different grain size as a function of pressure
图 8 钨的晶胞体积压缩率随压力的变化（实线是基于30和65 nm钨晶粒的晶胞体积压缩率-压力数据点，通过三阶Birch-Murnaghan状态方程拟合的曲线；离散的数据点为其他研究人员所得结果[8–9, 22–26]）
Figure 8. Volume compression ratio of unit cell for tungsten as a function of pressure (The solid lines are fitting curves of unit cell volume compression ratio and pressure for tungsten crystals with sizes of 30 and 65 nm by the third Birch-Murnaghan equation of state; the discrete data points are obtained by other researchers[8–9, 22–26])
表 1 各种晶粒尺寸下钨的体弹模量
Table 1. Bulk modulus of tungsten with a series of particle sizes
Grain size Pressure/GPa B0/GPa $B_0' $ Pressure transmitting
mediumMethod Ref. 30 nm
65 nm
50 nm
4−6 μm
<4 μm
4−6 μm
4−6 μm
4−6 μm
Bulk
Bulk0−20
0−30
16−53
0−69
0−153
0−96
0−96
0−96
264−676
0−300257(7)
343(8)
338
312(36)
295(4)
312(10)
256(2)
342(1)
280(9)
3094.32 (fixed)
4.32 (fixed)
4.32 (fixed)
4.32 (fixed)
4.32 (0.11)
4.32 (fixed)
4.32 (fixed)
4.32 (fixed)
4.32 (fixed)
4.32 (fixed)None
None
None
None
Helium
NoneAXRD
AXRD
RXRD (ψ=54.7°)
RXRD (ψ=54.7°)
AXRD
RXRD (ψ=54.7°)
RXRD (ψ=0°)
RXRD (ψ=90°)
Shock compression
Shock compressionThis work
This work
Ref. [7]
Ref. [8]
Ref. [22]
Ref. [9]
Ref. [9]
Ref. [9]
Ref. [23]
Ref. [24]
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