A Study on the Relation between Dielectric Characteristics and Mechanical Strength of Synthetic Diamond

CHEN Shu-Xin

doi:10.11858/gywlxb.1988.03.013

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Chinese Journal of High Pressure Physics > 1988 > 2(3): 285-287 .

CHEN Shu-Xin. A Study on the Relation between Dielectric Characteristics and Mechanical Strength of Synthetic Diamond[J]. Chinese Journal of High Pressure Physics, 1988, 2(3): 285-287 . doi: 10.11858/gywlxb.1988.03.013

Citation:

CHEN Shu-Xin. A Study on the Relation between Dielectric Characteristics and Mechanical Strength of Synthetic Diamond[J]. Chinese Journal of High Pressure Physics, 1988, 2(3): 285-287 . doi: 10.11858/gywlxb.1988.03.013

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A Study on the Relation between Dielectric Characteristics and Mechanical Strength of Synthetic Diamond

doi: 10.11858/gywlxb.1988.03.013

CHEN Shu-Xin

Institute of High-Temperature and High-Pressure Physics, Chengdu University of Science and Technology, Chengdu 610065, China

More Information

Corresponding author: CHEN Shu-Xin
Received Date: 03 May 1988
Rev Recd Date: 03 May 1988
Publish Date: 05 Sep 1988

Abstract

Abstract

The dielectric characteristics of synthetic diamond are related to its structural defects and mechanical strength. Experiments performed in this work showed that for the diamond being used as medium of a capacitor the more complete the crystal form is, the less increase of the capacitance is.
- diamond,
- dielectric characteristics,
- defect